Unreferenced date August 2007 Testability , a property applying to an empirical hypothesis , involves two components 1 the logical property that is variously described as contingency , defeasibility, or falsifiability , which means that counterexample s to the hypothesis are logically possible, and 2 the practical feasibility of observing a reproducibility reproducible series of such counterexamples if they do exist. In short, a hypothesis is testable if there is some real hope of deciding whether it is true or false of real experience. Upon this property of its constituent hypotheses rests the ability to decide whether a theory can be supported or falsified by the data of actual experience. If hypotheses are tested, initial results may also be labeled inconclusive. In engineering, this refers to the capability of an equipment or system to be tested. See also Confirmability Contingency controllability observability Scientific method Software testability Further reading portal box Philosophy of science Science Karl Popper Popper, K. R. 1968 The Logic of Scientific Discovery . London Hutchinson. Thomas Kuhn Thomas S. Kuhn 1962 The Structure of Scientific Revolutions Category Logic Category Philosophy of science Category Scientific terminology fr Testabilit nl Toetsbaarheid pt Testabilidade sv Testbarhet ... more details
Software testability is the degree to which a software artifact i.e. a software system, software module, requirements or design document supports testing in a given test context. Testability is not an intrinsic property of a software artifact and can not be measured directly such as software size . Instead testability is an extrinsic property which results from interdependency of the software to be tested and the test goals, test methods used, and test resources i.e., the test context . A lower degree of testability results in increased test effort . In extreme cases a lack of testability may hinder testing parts of the software or software requirements u at all u . Background The effort and effectiveness of software tests depends on numerous factors including properties of the software requirements properties of the software itself such as size, complexity and testability properties of the test methods used properties of the development and testing processes qualification and motivation of the persons involved in the test process Testability of Software Components The testability of software components modules, classes is determined by factors such as controllability The degree to which it is possible to control the state of the component under test CUT as required for testing. observability The degree to which it is possible to observe intermediate and final test results. isolateability The degree to which the component under test CUT can be tested in isolation. separation of concerns ... in parallel. The testability of software components can be improved by Test driven development design for testability similar to design for test in the hardware domain Testability of Requirements ... Software Testing testability References Robert V. Binder Testing Object Oriented Systems Models ... FDP sj929.pdf Improving testability of object oriented systems , ISBN 3 89825 781 9 Wanderlei ... Abstract Testability Patterns , ISSN 1884 0760 Category Software testing ar de Testbarkeit ... more details
Multiple issues orphan November 2006 unreferenced February 2009 notability December 2011 A term coined by Karl Popper in his famous work The Logic of Scientific Discovery to denote what he regarded as the main problem of methodology and the philosophy of science , i.e. to explain and promote the further growth of scientific knowledge. To this purpose, Popper advocated his theory of falsifiability , testability and testing. See also Falsification DEFAULTSORT Growth Of Knowledge Category Philosophy of science Category Knowledge philosophy stub ... more details
testabilitytestability of a function, module and eventually the software as a whole. In simple ... complexity is a predicate for the goal testability , and as CC increases, testability becomes ... goal Testability . Simply, by setting weights it is possible to control which predicates contribute ... more details
Is a procedure that rates testability by relating the number of fabrication defects that can in fact be detected with a test vector set under consideration to the total number of conceivable faults. It is used for refining both the Design For Test test circuitry and the Automatic test pattern generation test patterns iteratively, until a satisfactory fault coverage is obtained. ref citation title Digital Integrated Circuit Design From VLSI Architectures to CMOS Fabrication first Hubert last Kaeslin page 24 publisher Cambridge University Press url http books.google.com books?id gdRStcYgf2oC&pg PA24&dq 22fault grading 22 ref See also Automatic test pattern generation Design for Test References references Category Hardware testing ... more details
Dr Martin R. Woodward 28 May 1948 27 October 2006 was a United Kingdom British computer scientist who made leading contributions in the field of in software testing . ref DBLP id Woodward Martin R ref ref http en.scientificcommons.org martin woodward Martin Woodward , Scientific Commons . ref Martin Woodward was an academic in the Department of Computer Science at the University of Liverpool in England . As part of his leading role in software testing, for 13 years, until shortly before his death, Woodward was the Chief Editor of the journal Software Testing, Verification and Reliability STVR , a major international journal in the field of software testing. ref http doi.wiley.com 10.1002 stvr.363 A Tribute to Martin Woodward , Software Testing, Verification and Reliability , 16 209 211, 2006. doi 10.1002 stvr.363 ref Woodward undertook software testing research in areas such as mutation testing , ref An Integrated System for Program Testing Using Weak Mutation and Data Flow Analysis , 1985. ref ref cite web url http www.dcs.kcl.ac.uk pg jiayue repository search author.php?name Martin 20R. 20Woodward title Martin R. Woodward publisher King s College London work http www.dcs.kcl.ac.uk pg jiayue repository Mutation Testing Repository accessdate November 8, 2011 ref maturity model s, ref Towards a Maturity Model for Empirical Studies of Software Testing , 2000. ref testability , ref Investigating the Partial Relationships Between Testability and the Dynamic Range to Domain Ratio , 2003. ref etc. References Reflist External links AcademicSearch 167382 Persondata Metadata see Wikipedia Persondata . NAME Woodward, Martin R. ALTERNATIVE NAMES SHORT DESCRIPTION Computer scientist DATE OF BIRTH 28 May 1948 PLACE OF BIRTH United Kingdom DATE OF DEATH 27 October 2006 PLACE OF DEATH United Kingdom DEFAULTSORT Woodward, Martin Category 1948 births Category 2006 deaths Category Academics of the University of Liverpool Category English computer scientists Category Software testing ... more details
Programmable Built In Self Test PBIST is a memory Design for Testability DFT feature that incorporates all the required test systems into the chip itself. The test systems implemented on chip are as follows algorithmic address generator algorithmic data generator program storage unit loop control mechanisms PBIST was originally adopted by large memory chips that have high pin counts and operate at high frequencies, thereby exceeding the capability of production testers. The purpose of PBIST is to avoid developing and buying more sophisticated and very expensive testers. The interface between PBIST, which is internal to the processor, and the external tester environment is through the standard JTAG Test Access Port TAP controller pins. Algorithms and controls are fed into the chip through the TAP controller s Test Data Input TDI pin. The final result of the PBIST test is read out through the Test Data Output TDO pin. PBIST supports the entire algorithmic memory testing requirements imposed by the production testing methodology. In order to support all of the required test algorithms, PBIST must have the capability to store the required programs locally in the device. It must also be able to perform different address generation schemes, different test data pattern generation, looping schemes, and data comparisons. Part of the Built in self test . External links http developer.intel.com technology itj q21998 pdf fa.pdf An Overview of Advanced Failure Analysis Techniques for Pentium and Pentium Pro Microprocessors Category Electronic design automation Category Hardware testing electronics stub ... more details
Image Beetle ASIC.jpg thumb 200px right Beetle chip The Beetle Application specific integrated circuit ASIC is an analog readout chip. It is developed for the LHCb experiment at CERN . Overview The chip integrates 128 channels with low noise charge sensitive pre amplifiers and shapers. The pulse shape can be chosen such that it complies with LHCb specifications a peaking time of 25 ns with a remainder of the peak voltage after 25 ns of less than 30 . A comparator per channel with configurable polarity provides a binary signal. Four adjacent comparator channels are being Logical disjunction OR ed Clarify date April 2010 What does OR mean? and brought off chip via LVDS drivers. Either the shaper or comparator output is sampled with the LHC bunch crossing frequency of 40 MHz into an analog pipeline. This ring buffer has a programmable latency of a maximum of 160 sampling intervals and an integrated derandomising buffer of 16 stages. For analogue readout data is multiplexed with up to 40 MHz onto one or four ports. A binary readout mode operates at up to 80 MHz output rate on two ports. Current drivers bring the serialised data off chip. The chip can accept trigger rates up to 1.1 MHz to perform a dead timeless readout within 900 ns per trigger. For testability and calibration purposes, a charge injector with adjustable pulse height is implemented. The bias settings and various other parameters can be controlled via a standard I C interface. The chip is radiation hardened to an accumulated dose of more than 100 rad unit Mrad . Robustness against single event upset is achieved by redundant logic. External links http wwwasic.kip.uni heidelberg.de lhcb Beetle a readout chip for LHCb http lhcb.web.cern.ch lhcb The Large Hadron Collider beauty experiment Category Integrated circuits Category Large Hadron Collider particle stub ... more details
FURPS is an acronym representing a model for classifying software quality attributes Functional requirements functional & Non functional requirements non functional requirements Functional requirements F unctionality Feature set, Capabilities, Generality, Security Usability U sability Human factors, Aesthetics, Consistency, Documentation Reliability engineering R eliability Frequency severity of failure, Recoverability, Predictability, Accuracy, Mean time to failure Computer performance P erformance Speed, Efficiency, Resource consumption, Throughput, Response time Serviceability computer S upportability Testability, Extensibility, Adaptability, Maintainability, Compatibility, Configurability, Serviceability, Installability, Localizability, Portability The model, developed at Hewlett Packard , was first publicly elaborated by Grady and Caswell. FURPS is now widely used in the software industry. The was later added to the model after various campaigns at HP to extend the acronym to emphasize various attributes. See also Requirements analysis Types of Requirements Types of Requirements Further reading cite book last Watson first Mike title Managing Smaller Projects A Practical Approach publisher Multi Media Publications Inc. year 2006 pages 117 ff isbn 9781895186857 cite book last Kenett first Ron coauthors Baker, Emanuel title Software Process Quality Management and Control publisher CRC Press year 1999 pages 130 ff isbn 9780824717339 cite book last Grady first Robert coauthors Caswell, Deborah title Software Metrics Establishing a Company wide Program publisher Prentice Hall year 1987 pages 159 isbn 0138218447 cite book last Grady first Robert title Practical Software Metrics for Project Management and Process Improvement publisher Prentice Hall year 1992 pages 32 isbn 0138218447 External links http www.ibm.com developerworks rational library 4706.html N100A7 IBM on Furps Category Software requirements Category Mnemonics software eng stub cs FURPS de FURPS it Furps ... more details
Refimprove date June 2009 italictitle Infobox journal editor Fabrizio Lombardi discipline former names Transactions of the I.R.E. Professional Group on Electronic Computers, br IRE Transactions on Electronic Computers, br IEEE transactions on electronic computers abbreviation IEEE Trans Comput publisher Institute of Electrical and Electronics Engineers country United States frequency Monthly history 1952 website http www.computer.org portal web tc link1 name OPAC Link link1 http ieeexplore.ieee.org servlet opac?punumber 12 OCLC 1799331 LCCN 75642478 CODEN ITCOB4 ISSN 0018 9340 eISSN 1557 9956 The IEEE Transactions on Computers TC is a monthly Academic journal journal published by the Institute of Electrical and Electronics Engineers IEEE Computer Society . It contains peer review ed articles and other contributions in the area of computer design by electrical and computer engineers. It is intended for researchers, developers, educators, and technical managers in the computer field. It is widely considered to be one of the leading journals in the area. ref cite web title Journal Rankings date July 2008 work CORE The Computing Research and Education Association of Australasia accessdate 2009 10 28 url http www.core.edu.au journal 20rankings Journal 20Rankings.html Dead link date October 2010 bot H3llBot IEEE Transactions on Computers received the highest possible ranking A . ref Areas of interest for the journal include, but are not limited to computer organizations and architectures operating systems, software systems, and communication protocols real time systems and embedded systems digital devices, computer components, and interconnection networks specification, design, prototyping, and testing methods and tools performance, fault tolerance, reliability, security, and testability case studies and experimental and theoretical evaluations and new and important applications and trends. References Reflist External links http ieeexplore.ieee.org Xplore guesthome.jsp IE ... more details
Context date October 2009 One source date October 2007 Portal Software Testing In software development , test effort refers to the expenses for still to come tests. There is a relation with test costs and failure costs direct, indirect, costs for fault correction . Some factors which influence test effort are maturity of the Software Development Process software development process , Quality business quality and software testability testability of the testobject, test infrastructure, skills of staff members, quality goals and test strategy . Methods for estimation of the test effort To analyse all factors is difficult, because most of the factors influence each other. Following approaches can be used for the estimation top down estimation and bottom up estimation. The top down techniques are formula based and they are relative to the expenses for development Function point analysis Function Point Analysis FPA and Test Point Analysis TPA amongst others. Bottom up techniques are based on detailed information and involve often experts. The following techniques belong here Work Breakdown Structure Work Breakdown Structure WBS and Wideband delphi Wide Band Delphi WBD . We can also use the following techniques for estimating the test effort Conversion of software size into person hours of effort directly using a conversion factor. For example, we assign 2 person hours of testing effort per one Function Point of software size or 4 person hours of testing effort per one use case point or 3 person hours of testing effort per one Software Size Unit Conversion of software size into testing project size such as Test Points or Software Test Units using a conversion factor and then convert testing project size into effort Compute testing project size using Test Points of Software Test Units. Methodology for deriving the testing project size in Test Points is not well documented. However, methodology for deriving Software Test Units is defined in a paper by Murali Chemuturi We can ... more details
Merge to Form Test Services Leader. Key Areas of Business Design for Testability DFT Test interface ... title Tessolve evaluates DeFacTo RTL testability solution coauthors Anne Francoise Pele date 06 ... more details
of SQALE characteristics are the following SQALE Testability Index STI SQALE Reliability Index SRI ... to the testability, the reliability, the changeability, the maintainability... This classification ... more details
Model specific registers MSRs are control register s provided by x86 processor architectures. MSRs are used for performance monitoring , debugging , testability and program execution tracing , but also to enable and disable certain model specific features of the processor implementation. History With the introduction of the 80386 processor, Intel began introducing experimental features that would not necessarily be present in future versions of the processor. The first of these were two test registers T6 and T7 that allowed the 80386 to speed up virtual to physical address conversions. Three additional test registers followed in the 80486 TR3 TR5 that enabled testing of the processor s caches for code and data. None of these five registers were implemented in the subsequent Pentium processor. ref http cs.usfca.edu cruse cs630f06 lesson27.ppt Alan Cruse, lecture notes, Advanced Microcomputer Programming class, University of San Francisco, 2006 ref With the introduction of the Pentium processor, Intel provided a pair of instructions rdmsr and wrmsr to access current and future model specific registers , as well as the CPUID instruction to determine which features are present on a particular model. Many of these registers have proven useful enough to be retained. Intel has classified these as architectural model specific registers and has committed to their inclusion in future product lines. ref http http download.intel.com products processor manual 325384.pdf Intel 64 and IA 32 Architectures Software Developer s Manual Volume 3 System Programming Guide, 325384 042US, Section 34.1, March, 2012. ref Using MSRs Reading and writing to these registers is handled by the rdmsr and wrmsr instructions, respectively. As these are privileged instructions they must be executed by the operating system. Use of the Linux msr kernel module creates a pseudo file dev cpu x msr with a unique x for each processor or processor core . A user with permissions to read and or write to this fi ... more details
?DBIx Class DBIx Class , ActionScript and Python programming language Python . Criticism Testability ... is quite difficult. The negative effects on testability in the Active Record pattern can be minimized ... more details
, maintainability, availability, and testability. ref name refB By Ribera. Preliminary design The preliminary ... Operating and nonoperating environmental stimuli Test requirements External dimensions Maintenance and testability ... more details
on the order of local testability of finite automata. ref A. N. Trahtman. Optimal estimation on the order of local testability of finite automata. Theoret. Comput. Sci., 231 2000 , 59 74. ref ... more details
Image Einstein theory triumphs.png right thumb 150px The New York Times of November 10, 1919, reported on Einstein s confirmed prediction of gravitation on space, called the gravitational lens effect. The predictive power of a scientific theory refers to its ability to generate testability testable predictions. Theories with strong predictive power are highly valued, because the predictions can often encourage the falsifiability falsification of the theory. The concept of predictive power differs from explanatory power explanatory and descriptive power where phenomena that are already known are retrospectively explained by a given theory in that it allows a prospective test of theoretical understanding. Scientific ideas that do not confer any predictive power are considered at best conjecture s , or at worst pseudoscience . Because they cannot be tested or falsified in any way, there is no way to determine whether they are true or false, and so they do not gain the status of scientific theory . Theories whose predictive power presupposes technologies that are not currently possible constitute something of a grey area. For example, certain aspects of string theory have been labeled as predictive, but only through the use of machines that have not yet been built and in some cases may never be possible. Whether or not this sort of theory can or should be considered truly predictive is a matter of scientific and philosophical debate. Examples A classic example of the predictive power of a theory is the Discovery of Neptune as a result of predictions made by mathematicians John Couch Adams and Urbain Le Verrier , based on Newton s theory of gravity. Other examples of predictive power of theories or models include Dmitri Mendeleev s use of his periodic table to predict previously undiscovered chemical element s and their properties though largely correct, he misjudged the relative atomic masses of tellurium and iodine , and Charles Darwin s use of his knowledge of evoluti ... more details
system or part design improvements based on reliability, maintainability, testability or system ... up specific criteria for repair, including Built In Test Equipment BITE requirements, testability, reliability ... for testability and design for discard must be considered during system design. The basic requirements ... more details
introduction NPI group, a test engineer ensures that a product is designed for both testability .... The following are some general rules to ensure testability and manufacturability of a product Making ... final products. Problem is, because of these shortcuts, the product s manufacturability and testability ... test requirement design specification Design for test Design for testability DFT Design ... more details
Design for Test aka Design for Testability or DFT is a name for Integrated circuit design design techniques that add certain testability features to a integrated circuit microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply manufacturing tests for the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no defects that could, otherwise, adversely affect the product s correct functioning. Tests are applied at several steps in the Semiconductor fabrication hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer s environment. The tests generally are driven by Automated testing test programs that execute in Automatic test equipment Automatic Test Equipment ATE or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects i.e., the test fails , tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate the source of the failure. DFT plays an important role in the development of test programs and as an interface for test application and diagnostics. Automatic test pattern generation , or ATPG, is much easier if appropriate DFT rules and suggestions have been implemented. History DFT techniques have been used at least since the early days of electric electronic data processing equipment. Early examples from the 1940s 50s are the switches and instruments that allowed an engineer to scan i.e., selectively probe the voltage current at some internal nodes in an analog computer analog scan . DFT often is associated with design modifications that provide improved access to internal circuit elements such that the local internal state can be controlled ... http focus.ti.com lit an ssya002c ssya002c.pdf IEEE Std 1149.1 JTAG Testability Primer A technical ... more details
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